2016 IEEE 22nd international symposium on on-line testing and robust system design : (IOLTS 2016) : Sant Feliu de Guixols, Spain : 4-6 July 2016 : IEEE events : Jul 2016, Sant Feliu de Guixols, Spain.

2016 IEEE 22nd international symposium on on-line testing and robust system design : (IOLTS 2016) : Sant Feliu de Guixols, Spain : 4-6 July 2016 : IEEE events : Jul 2016, Sant Feliu de Guixols, Spain.

Call No. (NDL): M17-18-1141
Bibliographic ID of National Diet Library: 028381015

Material type: 図書

Author: IEEE International On-Line Testing Symposium (22nd : 2016 : San Felíu de Guixols, Spain)ほか

Publisher: IEEE

Publication date: [2016]

Material Format: Paper

Capacity, size, etc.: xiii, 256 pages ; 28 cm

NDC: -

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Notes on use

Note (General)：: Program, an abstract and papers."This is an exciting year for your symposium, which broadens its scope to include all aspects of Robust System Design ...

Other physical details：: illustrations

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Paper

Material Type: 図書
ISBN: 9781509015085 (Print-On-Demand)
ISSN: 1942-9398
Title: 2016 IEEE 22nd international symposium on on-line testing and robust system design : (IOLTS 2016) : Sant Feliu de Guixols, Spain : 4-6 July 2016 : IEEE events : Jul 2016, Sant Feliu de Guixols, Spain.
Author Heading: IEEE International On-Line Testing Symposium (22nd : 2016 : San Felíu de Guixols, Spain)
University of Athens.
TIMA Laboratory.
Publication, Distribution, etc.: Piscataway, NJ : IEEE (出版)
Publication Date (W3CDTF): 2016
Extent: xiii, 256 pages
Other physical details: illustrations
Size: 28 cm
Place of Publication (Country Code): US
Text Language Code: eng
Genre/Form Terms: Conference papers and proceedings.
Content Type: text
Media Type: unmediated
Carrier Type: volume
Subject Heading: Error-correcting codes (Information theory)--Congresses.
Electronic circuit design--Congresses.
Online data processing--Congresses.
Electronic circuits--Testing--Congresses.
Electronic circuit design.
Electronic circuits--Testing.
Error-correcting codes (Information theory)
Online data processing.
LCC: TK7867
NDLC: M17
Target Audience: 一般
Note (General): Program, an abstract and papers.
"This is an exciting year for your symposium, which broadens its scope to include all aspects of Robust System Design and is held in the context of the 1st IEEE Federative Event on Design for Robustness (FEDfRo)."--Page ii.
"... starting from this year IOLTS is organized under the umbrella of the IEEE Federative Event on Design for Robustness ... which brings together at the same time and place, three IEEE events (IOLTS, IMSTW, and IVSW)."--Page ii.
IEEE catalog number CFP16OLT-POD.
Note (Bibliography): Includes bibliographical references and author index.
Holding library: 国立国会図書館
Call No.: M17-18-1141
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 028381015
http://id.ndl.go.jp/bib/028381015
Cataloging Rule: RDA
Bibliographic Record Category (NDL): 215