2016 IEEE 25th North Atlantic test workshop (NATW 2016) : Providence, Rhode Island, USA : 9-11 May 2016 : May 2016, Providence, RI.

Call No. (NDL): M17-18-1582
Bibliographic ID of National Diet Library: 028452731

Material type: 図書

Author: IEEE North Atlantic Test Workshop (25th : 2016 : Providence, R.I.)

Publisher: IEEE

Publication date: [2016]

Material Format: Paper

Capacity, size, etc.: x, 59 pages ; 28 cm

NDC: -

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Notes on use

Note (General)：: Papers."In addition to the research papers we have a tutorial, ..."--Page vii.IEEE catalog number CFP16NAT-POD.

Other physical details：: illustrations

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Paper

Material Type: 図書
ISBN: 9781467389501 (print-on-demand)
Title: 2016 IEEE 25th North Atlantic test workshop (NATW 2016) : Providence, Rhode Island, USA : 9-11 May 2016 : May 2016, Providence, RI.
Author Heading: IEEE North Atlantic Test Workshop (25th : 2016 : Providence, R.I.)
Publication, Distribution, etc.: Piscataway, NJ : IEEE (出版)
Publication Date: [2016]
Publication Date (W3CDTF): 2016
Extent: x, 59 pages
Other physical details: illustrations
Size: 28 cm
Place of Publication (Country Code): US
Text Language Code: eng
Genre/Form Terms: Conference papers and proceedings.
Content Type: text
Media Type: unmediated
Carrier Type: volume
Subject Heading: Embedded computer systems--Congresses.
Random access memory--Congresses.
Systems on a chip--Testing--Congresses.
Integrated circuits--Testing--Congresses.
Embedded computer systems.
Integrated circuits--Testing.
Random access memory.
LCC: TK7895.E42
NDLC: M17
Target Audience: 一般
Note (General): Papers.
"In addition to the research papers we have a tutorial, ..."--Page vii.
IEEE catalog number CFP16NAT-POD.
Note (Content): Discussion of latest issues relating to test methodologies and design.
Note (Bibliography): Includes bibliographical references and author index.
Holding library: 国立国会図書館
Call No.: M17-18-1582
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 028452731
http://id.ndl.go.jp/bib/028452731
Cataloging Rule: RDA
Bibliographic Record Category (NDL): 215