2016 IEEE international integrated reliability workshop : (IIRW 2016) : South Lake Tahoe, California, USA : 9-13 October 2016 : Oct 2016, South Lake Tahoe, CA.

• Material Type: 図書
• ISBN: 9781509041947 (Print-On-Demand)
• ISSN: 1930-8841
• Title: 2016 IEEE international integrated reliability workshop : (IIRW 2016) : South Lake Tahoe, California, USA : 9-13 October 2016 : Oct 2016, South Lake Tahoe, CA.
• Author Heading: International Integrated Reliability Workshop (2016 : South Lake Tahoe, Calif.)
• Publication, Distribution, etc.: Piscataway, NJ : IEEE (出版)
• Publication Date: [2016]; 著作権日付 : ©2016
• Publication Date (W3CDTF): 2016
• Extent: xlvi, 106 pages
• Other physical details: illustrations
• Size: 28 cm
• Place of Publication (Country Code): US
• Text Language Code: eng
• Genre/Form Terms: Conference papers and proceedings.
• Content Type: text
• Media Type: unmediated
• Carrier Type: volume
• Subject Heading: Integrated circuits--Reliability--Congresses.; Integrated circuits--Wafer-scale integration--Reliability--Congresses.; Semiconductors--Reliability--Congresses.; Integrated circuits--Reliability.; Integrated circuits--Wafer-scale integration--Reliability.; Semiconductors--Reliability.
• NDLC: M17
• Target Audience: 一般
• Note (General): Abstracts, presentations and papers.; IEEE catalog number CFP16IRW-POD.
• Note (Bibliography): Includes bibliographical references and author index.
• Holding library: 国立国会図書館
• Call No.: M17-18-1892
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 028503693; http://id.ndl.go.jp/bib/028503693
• Cataloging Rule: RDA
• Bibliographic Record Category (NDL): 215