Optical measurement systems for industrial inspection X : 26-29 June 2017 : Munich, Germany : optical measurement systems for industrial inspection conference : SPIE optical metrology symposium : world of photonics congress : Jun 2017, Munich, Germany.

• Material Type: 図書
• ISBN (set): 9781510611030 (set)
• ISSN (series): 0277-786X
• Title: Optical measurement systems for industrial inspection X : 26-29 June 2017 : Munich, Germany : optical measurement systems for industrial inspection conference : SPIE optical metrology symposium : world of photonics congress : Jun 2017, Munich, Germany.
• Series Title: SPIE Proceedings ; 10329
• Author Heading: European Optical Society (EOS); Wissenschaftliche Gesellschaft Lasertechnik (WLT)
• Publication, Distribution, etc.: Bellingham, Washington, USA : SPIE (出版)
• Publication Date: [2017]
• Publication Date (W3CDTF): 2017
• Extent: 2 volumes
• Size: 28 cm.
• Alternative Title: Optical measurement systems for industrial inspection 10 : 26-29 June 2017 : Munich, Germany; SPIE. optical metrology
• Place of Publication (Country Code): US
• Text Language Code: eng
• Content Type: text
• Media Type: unmediated
• Carrier Type: volume
• NDLC: M17
• Target Audience: 一般
• Note (General): Papers.
• Note (Bibliography): Includes bibliographical references and author index.
• Holding library: 国立国会図書館
• Call No.: M17-18-2019
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 028516601; http://id.ndl.go.jp/bib/028516601
• Cataloging Rule: RDA
• Bibliographic Record Category (NDL): 215