2016 11th international design & test symposium (IDT 2016) : Hammamet, Tunisia : 18-20 December 2016 : IEEE technically co-sponsored event : IDT2016 conference : Dec 2016, Hammamet, Tunisia.

Call No. (NDL): M17-19-110
Bibliographic ID of National Diet Library: 028525978

Material type: 図書

Author: International Design and Test Workshop (11th : 2016 : Ḥammāmāt, Tunisia)ほか

Publisher: IEEE

Publication date: [2016]

Material Format: Paper

Capacity, size, etc.: xv, 333 pages ; 28 cm

NDC: -

View All

Notes on use

Note (General)：: Abstracts and papers."... to the Program Committee for all its hard work, contributing so importantly to the success of the annual meeting."--Welcome ...

Other physical details：: illustrations

Search by Bookstore

Bibliographic Record

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Paper

Material Type: 図書
ISBN: 9781509049011 (Print-On-Demand)
ISSN: 2162-0601
Title: 2016 11th international design & test symposium (IDT 2016) : Hammamet, Tunisia : 18-20 December 2016 : IEEE technically co-sponsored event : IDT2016 conference : Dec 2016, Hammamet, Tunisia.
Author Heading: International Design and Test Workshop (11th : 2016 : Ḥammāmāt, Tunisia)
University of Sfax. National Engineering School of Sfax. CES Laboratory.
Publication, Distribution, etc.: Piscataway, NJ : IEEE (出版)
Publication Date (W3CDTF): 2016
Extent: xv, 333 pages
Other physical details: illustrations
Size: 28 cm
Place of Publication (Country Code): US
Text Language Code: eng
Genre/Form Terms: Conference papers and proceedings.
Content Type: text
Media Type: unmediated
Carrier Type: volume
Subject Heading: Electronic systems--Design and construction--Congresses.
Electronic systems--Testing--Congresses.
Electronic circuit design--Congresses.
Electronic circuits--Testing--Congresses.
System design--Congresses.
Electronic circuit design.
Electronic circuits--Testing.
Electronic systems--Design and construction.
Electronic systems--Testing.
System design.
LCC: TK7870
NDLC: M17
Target Audience: 一般
Note (Target Audience): Scholarly & Professional
Note (General): Abstracts and papers.
"... to the Program Committee for all its hard work, contributing so importantly to the success of the annual meeting."--Welcome to the IDT 2016.
IEEE catalog number CFP1663D-POD.
Note (Content): Annotation
Note (Bibliography): Includes bibliographical references.
Holding library: 国立国会図書館
Call No.: M17-19-110
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 028525978
http://id.ndl.go.jp/bib/028525978
Cataloging Rule: RDA
Bibliographic Record Category (NDL): 215