Applied optical metrology II : 8-9 August 2017 : San Diego, California, United States : Aug 2017, San Diego, CA.

• Material Type: 図書
• ISBN: 9781510612037
• ISSN (series): 0277-786X
• Title: Applied optical metrology II : 8-9 August 2017 : San Diego, California, United States : Aug 2017, San Diego, CA.
• Series Title: SPIE Proceedings ; 10373
• Title Heading: Proceedings of SPIE--the International Society for Optical Engineering ; Volume 10373. 1996-756X
• Author Heading: International Conference on Applied Optical Metrology (2nd : 2017 : San Diego, Calif.); Novak, Erik.; Trolinger, Jim.
• Publication, Distribution, etc.: Bellingham, Washington, USA : SPIE (出版)
• Publication Date: [2017]
• Publication Date (W3CDTF): 2017
• Extent: 1 volume (various pagings)
• Size: 28 cm.
• Alternative Title: Applied optical metrology 2 : 8-9 August 2017 : San Diego, California, United States; SPIE. optics + photonics; Applied optical metrology II : 8-10 August 2017 : San Diego, California, United States
• Place of Publication (Country Code): US
• Text Language Code: eng
• Genre/Form Terms: Conference papers and proceedings.
• Content Type: text
• Media Type: unmediated
• Carrier Type: volume
• Subject Heading: Optical measurements--Congresses.; Holographic interferometry--Congresses.; Holographic interferometry.; Optical measurements.
• LCC: QC367
• DDC: 681.25
• NDLC: M17
• Target Audience: 一般
• Note (General): Papers.
• Note (Bibliography): Includes bibliographical references and author index.
• Holding library: 国立国会図書館
• Call No.: M17-19-922
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 028821104; http://id.ndl.go.jp/bib/028821104
• Cataloging Rule: RDA
• Bibliographic Record Category (NDL): 215