Handbook of diagnostic classification models : models and model extensions, applications, software packages

• Material Type: 図書
• ISBN: 9783030055837; 3030055833
• ISBN (error code): 9783030055844 (eBook)
• ISSN (series): 2367-170X
• Title: Handbook of diagnostic classification models : models and model extensions, applications, software packages
• Author/Editor: Matthias von Davier, Young-Sun Lee, editors.
• Series Title: Methodology of educational measurement and assessment
• Title Heading: Methodology of educational measurement and assessment. 2367-170X
• Author Heading: Davier, Matthias von.; Lee, Young-Sun.
• Publication, Distribution, etc.: Cham, Switzerland : Springer (出版)
• Publication Date: [2019]; 著作権日付 : ©2019
• Publication Date (W3CDTF): 2019
• Extent: xiv, 656 pages
• Other physical details: illustrations
• Size: 25 cm.
• Place of Publication (Country Code): CH
• Text Language Code: eng
• Genre/Form Terms: Handbooks and manuals.
• Content Type: txt : text
• Media Type: n : unmediated
• Carrier Type: nc : volume
• Subject Heading: Educational tests and measurements--Handbooks, manuals, etc.; Educational tests and measurements.
• LCC: LB3051
• NDLC: FC63
• Target Audience: 一般
• Note (Bibliography): Includes bibliographical references and index.
• Holding library: 国立国会図書館
• Call No.: FC63-D1
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 029588512; http://id.ndl.go.jp/bib/029588512
• OCLC No.: 1064297367; https://www.worldcat.org/oclc/1064297367
• Cataloging Rule: RDA
• Bibliographic Record Category (NDL): 211

• Contents: Introduction : From Latent Classes to Cognitive Diagnostic Models / Matthias von Davier and Young-Sun LeeNonparametric Item Response Theory and Mokken...
• Summary, etc.: This handbook provides an overview of major developments around diagnostic classification models (DCMs) with regard to modeling, estimation, model che...