Infrared imaging systems: design, analysis, modeling, and testing XXX : 16-18 April 2019 : Baltimore, Maryland, United States : annual defense and commercial sensing conference : IIS subconference : Apr 2019, Baltimore, MD. (SPIE Proceedings ; 11001)

Infrared imaging systems: design, analysis, modeling, and testing XXX : 16-18 April 2019 : Baltimore, Maryland, United States : annual defense and commercial sensing conference : IIS subconference : Apr 2019, Baltimore, MD.

(SPIE Proceedings ; 11001)

Call No. (NDL): M17-20-933
Bibliographic ID of National Diet Library: 029913146

Material type: 図書

Author: SPIE (Society)

Publisher: SPIE

Publication date: [2019]

Material Format: Paper

Capacity, size, etc.: 1 volume (various pagings) ; 28 cm.

NDC: -

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Notes on use

Note (General)：: A presentation and papers."The SPIE Infrared Imaging Systems: Design, Analysis, Modeling & Testing subconference is now holding its 30th annual confer...

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Paper

Material Type: 図書
ISBN: 9781510626676
ISSN (series): 0277-786X
Title: Infrared imaging systems: design, analysis, modeling, and testing XXX : 16-18 April 2019 : Baltimore, Maryland, United States : annual defense and commercial sensing conference : IIS subconference : Apr 2019, Baltimore, MD.
Series Title: SPIE Proceedings ; 11001
Author Heading: SPIE (Society)
Publication, Distribution, etc.: Bellingham, Washington, USA : SPIE (出版)
Publication Date: [2019]
Publication Date (W3CDTF): 2019
Extent: 1 volume (various pagings)
Size: 28 cm.
Alternative Title: Infrared imaging systems: design, analysis, modeling, and testing 30 : 16-18 April 2019 : Baltimore, Maryland, United States
Infrared imaging systems: design, analysis, modeling, and testing XXX : at SPIE defense + commercial sensing : 16-18 April 2019 : Baltimore, Maryland, United States
Place of Publication (Country Code): US
Text Language Code: eng
Content Type: text
Media Type: unmediated
Carrier Type: volume
NDLC: M17
Target Audience: 一般
Note (General): A presentation and papers.
"The SPIE Infrared Imaging Systems: Design, Analysis, Modeling & Testing subconference is now holding its 30th annual conference ..."--Page 1100102-1.
Note (Bibliography): Includes bibliographical references and author index.
Holding library: 国立国会図書館
Call No.: M17-20-933
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 029913146
http://id.ndl.go.jp/bib/029913146
Cataloging Rule: RDA
Bibliographic Record Category (NDL): 215