Defects and materials issues in semiconductors--relationship to optoelectronic properties and device reliability : April 6-10, 2015 : San Francisco, California, USA : Apr 2015, San Francisco, CA. (Materials Research Society Symposia Proceedings ; 1792)

Defects and materials issues in semiconductors--relationship to optoelectronic properties and device reliability : April 6-10, 2015 : San Francisco, California, USA : Apr 2015, San Francisco, CA.

(Materials Research Society Symposia Proceedings ; 1792)

Call No. (NDL): M17-20-1460
Bibliographic ID of National Diet Library: 030547820

Material type: 図書

Author: Defects and Materials Issues in Semiconductors--Relationship to Optoelectronic Properties and Device Reliability (Symposium) (2015 : San Francisco, Calif.)

Publisher: Cambridge University Press

Publication date: [2015]

Material Format: Paper

Capacity, size, etc.: 136 pages ; 24 cm.

NDC: -

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Notes on use

Note (General)：: Papers.

Other physical details：: illustrations (black and white)

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Paper

Material Type: 図書
ISBN: 9781713808206 paperback
Title: Defects and materials issues in semiconductors--relationship to optoelectronic properties and device reliability : April 6-10, 2015 : San Francisco, California, USA : Apr 2015, San Francisco, CA.
Series Title: Materials Research Society Symposia Proceedings ; 1792
Author Heading: Defects and Materials Issues in Semiconductors--Relationship to Optoelectronic Properties and Device Reliability (Symposium) (2015 : San Francisco, Calif.)
Publication, Distribution, etc.: Cambridge, United Kingdom : Cambridge University Press (出版)
Publication Date: [2015]
Publication Date (W3CDTF): 2015
Extent: 136 pages
Other physical details: illustrations (black and white)
Size: 24 cm.
Alternative Title: 2015 MRS spring meeting
Place of Publication (Country Code): GB
Text Language Code: eng
Genre/Form Terms: Conference papers and proceedings.
Content Type: text
Media Type: unmediated
Carrier Type: volume
Subject Heading: Semiconductors--Defects--Congresses.
Optoelectronic devices--Congresses.
Optoelectronic devices.
Semiconductors--Defects.
DDC: 537.622
NDLC: M17
Target Audience: 一般
Note (General): Papers.
Note (Bibliography): Includes bibliographical references and author index.
Holding library: 国立国会図書館
Call No.: M17-20-1460
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 030547820
http://id.ndl.go.jp/bib/030547820
OCLC No.: 1202890211
https://www.worldcat.org/oclc/1202890211
Cataloging Rule: RDA
Bibliographic Record Category (NDL): 215