Investigation and tuning of organic thin films by methods of atomic force microscopy

Search by Bookstore

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Material Type: 博士論文
Title: Investigation and tuning of organic thin films by methods of atomic force microscopy
Author/Editor: vorgelegt von Thorsten Simon Limböck
Author Heading: Limböck, Thorsten Simon
Publication, Distribution, etc.: Köln : Universität zu Köln (出版)
Publication Date: 2019
Publication Date (W3CDTF): 2019
Extent: VIII, 221 pages
Size: 21 cm
Degree grantor/type: Universität zu Köln
Date Granted (W3CDTF): 2019
Degree Type: Ph.D
Note (Dissertation): Thesis (doctoral)--Universität zu Köln, 2019
Place of Publication (Country Code): DE
Text Language Code: eng
Note (Text Language): Summary in English and German
Content Type: text
Media Type: unmediated
Carrier Type: volume
Target Audience: 一般
Note (Bibliography): Includes bibliographies
Holding library: 国立国会図書館
Call No.: M-DIGKO-1490
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 031280092
http://id.ndl.go.jp/bib/031280092
Cataloging Rule: RDA
Bibliographic Record Category (NDL): 216