A study on statistical reliability analyses in silicon oxide and magnesium oxide films due to localized defects

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Material Type: 博士論文
Title: A study on statistical reliability analyses in silicon oxide and magnesium oxide films due to localized defects
Author/Editor: Hyeonwoo Park [著]
Author Heading: 朴, 賢雨パク, ヒョンウ
Publication Date: [2020]
Publication Date (W3CDTF): 2020
Extent: 1冊
Alternative Title: シリコン酸化膜およびマグネシウム酸化膜における局所的欠陥起因の統計的信頼性解析に関する研究シリコンサンカマクオヨビマグネシウムサンカマクニオケルキョクショテキケッカンキインノトウケイテキシンライセイカイセキニカンスルケンキュウ
Degree grantor/type: 東北大学
Date Granted: 令和2年3月25日
Date Granted (W3CDTF): 2020
Dissertation Number: 甲第19304号
Degree Type: 博士(工学)
Note (Dissertation): 博士論文
Place of Publication (Country Code): JP
Text Language Code: eng
Content Type: テキスト
Media Type: 機器不用
Carrier Type: 冊子
NDLC: UT51
Target Audience: 一般
Note (General): 博士論文
Holding library: 国立国会図書館
Call No.: UT51-2020-A270
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 031445798
http://id.ndl.go.jp/bib/031445798
Bibliographic Record Category (NDL): 213