Second international conference on testing technology and automation engineering : (TTAE 2022) : 26-28 August 2022 : Changchun, China : 2nd intl. conference on testing technology and automation engineering : Aug 2022, Changchun, China. (SPIE Proceedings ; 12457)

Second international conference on testing technology and automation engineering : (TTAE 2022) : 26-28 August 2022 : Changchun, China : 2nd intl. conference on testing technology and automation engineering : Aug 2022, Changchun, China.

(SPIE Proceedings ; 12457)

Call No. (NDL): M17-23-193
Bibliographic ID of National Diet Library: 032630368

Material type: 図書

Author: East China Jiaotong University. Ministry of Education. Key Laboratory of Conveyance and Equipment.

Publisher: SPIE

Publication date: [2022]

Material Format: Paper

Capacity, size, etc.: 1 volume (various pagings) ; 28 cm.

NDC: -

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Note (General)：: Papers.

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Paper

Material Type: 図書
ISBN: 9781510660199
ISSN (series): 0277-786X
Title: Second international conference on testing technology and automation engineering : (TTAE 2022) : 26-28 August 2022 : Changchun, China : 2nd intl. conference on testing technology and automation engineering : Aug 2022, Changchun, China.
Series Title: SPIE Proceedings ; 12457
Author Heading: East China Jiaotong University. Ministry of Education. Key Laboratory of Conveyance and Equipment.
Publication, Distribution, etc.: Bellingham, Washington, USA : SPIE (出版)
Publication Date: [2022]
Publication Date (W3CDTF): 2022
Extent: 1 volume (various pagings)
Size: 28 cm.
Alternative Title: 2nd international conference on testing technology and automation engineering : (TTAE 2022) : 26-28 August 2022 : Changchun, China
Place of Publication (Country Code): US
Text Language Code: eng
Content Type: text
Media Type: unmediated
Carrier Type: volume
NDLC: M17
Target Audience: 一般
Note (General): Papers.
Note (Bibliography): Includes bibliographical references.
Holding library: 国立国会図書館
Call No.: M17-23-193
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 032630368
http://id.ndl.go.jp/bib/032630368
Cataloging Rule: RDA
Bibliographic Record Category (NDL): 215