図書

Scanning electron microscopy, 1977, V.1; Proceedings of the annual scanning electron microscope symposium, 10th and workshops on materials and component characterization/quality control with the SEM/STEM, SEM applications to semiconductors, analytical electron microscopy, biological specimen preparation for SEM.

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Scanning electron microscopy, 1977, V.1; Proceedings of the annual scanning electron microscope symposium, 10th and workshops on materials and component characterization/quality control with the SEM/STEM, SEM applications to semiconductors, analytical electron microscopy, biological specimen preparation for SEM.

Material type
図書
Author
Johari, O.(ed.)
Publisher
IIT Research Institute
Publication date
1977.
Material Format
Paper
Capacity, size, etc.
29 cm; xvi, 783 p.
NDC
-
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Paper

Material Type
図書
ISBN
0915802112
Title
Scanning electron microscopy, 1977, V.1; Proceedings of the annual scanning electron microscope symposium, 10th and workshops on materials and component characterization/quality control with the SEM/STEM, SEM applications to semiconductors, analytical electron microscopy, biological specimen preparation for SEM.
Author/Editor
Johari, O.(ed.)
Author Heading
Johari, O.
Publication, Distribution, etc.
Chicago : IIT Research Institute
Publication Date
1977.
Publication Date (W3CDTF)
1977
Extent
29 cm; xvi, 783 p.
Place of Publication (Country Code)
us