DESTRUCTIVE TESTING OF HYBRID MICROCIRCUITS CONTAINING THERMOCOMPRESSION BONDED DEVICES AND LEAD-INDIUM SOLDERED CAPACITORS. (BDX ; BDX-613-2081)

DESTRUCTIVE TESTING OF HYBRID MICROCIRCUITS CONTAINING THERMOCOMPRESSION BONDED DEVICES AND LEAD-INDIUM SOLDERED CAPACITORS.

(BDX ; BDX-613-2081)

This page shows libraries in Japan other than the National Diet Library that hold the material.

Please contact your local library for information on how to use materials or whether it is possible to request materials from the holding libraries.

other

Japan Atomic Energy Agency's Library Catalog
Paper
Japan Atomic Energy Agency's Library Catalog
Japan Atomic Energy Agency's Library Catalog
Paper
Japan Atomic Energy Agency's Library Catalog

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Material Type: 図書
Title: DESTRUCTIVE TESTING OF HYBRID MICROCIRCUITS CONTAINING THERMOCOMPRESSION BONDED DEVICES AND LEAD-INDIUM SOLDERED CAPACITORS.
Author/Editor: RATHBUN, D.A.
Series Title: BDX ; BDX-613-2081
Author Heading: RATHBUN, D.A.
Publication Date: 1978.
Publication Date (W3CDTF): 1978
Extent: 14
Target Audience: 一般
Data Provider (Database): 日本原子力研究開発機構 : 日本原子力研究開発機構所蔵目録データベース
https://library-documents.jaea.go.jp/opac/opac_search/