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図書

Quantitative study of vacancy defects in quenched tungsten by combined field-ion microscopy and electrical resistometry (DOE ; DOE/ER/05002-31; DE83006040)

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Quantitative study of vacancy defects in quenched tungsten by combined field-ion microscopy and electrical resistometry

(DOE ; DOE/ER/05002-31; DE83006040)

Material type
図書
Author
Park, J.Y. [et al.]
Publisher
Massachusetts Inst. of Tech.
Publication date
1983.
Material Format
Paper
Capacity, size, etc.
41 p.
NDC
-
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Paper

Material Type
図書
Title
Quantitative study of vacancy defects in quenched tungsten by combined field-ion microscopy and electrical resistometry
Author/Editor
Park, J.Y. [et al.]
Series Title
DOE ; DOE/ER/05002-31; DE83006040
Author Heading
Park, J.Y.
Huang, H.C.W.
Siegel, R.W.
Balluffi, R.W.
Publication, Distribution, etc.
Cambridge, MA (USA) : Massachusetts Inst. of Tech.
Publication Date
1983.
Publication Date (W3CDTF)
1983
Extent
41 p.
Place of Publication (Country Code)
us