UNIFIED MODEL OF CHARGE BUILD-UP AND ANNEALING OF OXIDE CHARGE AND INTERFACE STATES IN SIO/SUB 2/ DUE TO STRESS. (HMI ; HMI-B-465)

UNIFIED MODEL OF CHARGE BUILD-UP AND ANNEALING OF OXIDE CHARGE AND INTERFACE STATES IN SIO/SUB 2/ DUE TO STRESS.

(HMI ; HMI-B-465)

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Material Type: 図書
Title: UNIFIED MODEL OF CHARGE BUILD-UP AND ANNEALING OF OXIDE CHARGE AND INTERFACE STATES IN SIO/SUB 2/ DUE TO STRESS.
Author/Editor: WULF, F.
Series Title: HMI ; HMI-B-465
Author Heading: WULF, F.
Publication Date: 1989.
Publication Date (W3CDTF): 1989
Extent: 133
Target Audience: 一般
Data Provider (Database): 日本原子力研究開発機構 : 日本原子力研究開発機構所蔵目録データベース
https://library-documents.jaea.go.jp/opac/opac_search/