(ATOM PROBE FIELD-ION MICROSCOPY RESEATCH ON SILICON CARBIDE WHISKERS AND EVALUATE THE POSITION SENSITIVE ATOM PROBE). (ORNL ; ORNL/FTR-3090)

(ATOM PROBE FIELD-ION MICROSCOPY RESEATCH ON SILICON CARBIDE WHISKERS AND EVALUATE THE POSITION SENSITIVE ATOM PROBE).

(ORNL ; ORNL/FTR-3090)

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Material Type: 図書
Title: (ATOM PROBE FIELD-ION MICROSCOPY RESEATCH ON SILICON CARBIDE WHISKERS AND EVALUATE THE POSITION SENSITIVE ATOM PROBE).
Author/Editor: MILLER, M.K.
Series Title: ORNL ; ORNL/FTR-3090
Author Heading: MILLER, M.K.
Publication, Distribution, etc.: Oak Ridge National Laboratory(Oak Ridge National Laboratory)
Publication Date: 1988.
Publication Date (W3CDTF): 1988
Extent: 8
Place of Publication (Country Code): us
Text Language Code: eng
Target Audience: 一般
Data Provider (Database): 日本原子力研究開発機構 : 日本原子力研究開発機構所蔵目録データベース
https://library-documents.jaea.go.jp/opac/opac_search/