ENHANCED LOW-RATE RADIATION-INDUCED CHARGE TRAPPING AT THE EMITTER-BASE/OXIDE INTERFACE OF BIPOLARB DEVICES (SAND ; SAND-96-2092C)

ENHANCED LOW-RATE RADIATION-INDUCED CHARGE TRAPPING AT THE EMITTER-BASE/OXIDE INTERFACE OF BIPOLARB DEVICES

(SAND ; SAND-96-2092C)

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Material Type: 図書
Title: ENHANCED LOW-RATE RADIATION-INDUCED CHARGE TRAPPING AT THE EMITTER-BASE/OXIDE INTERFACE OF BIPOLARB DEVICES
Author/Editor: D. M. FLEETWOOD//ET AL. (SANDIA NATIONAL LABS. ALBUQUERQUE, NM.)
Series Title: SAND ; SAND-96-2092C
Author Heading: D. M. FLEETWOOD.
Publication, Distribution, etc.: Sandia National Laboratories(Sandia National Laboratories)
Publication Date: 1996.
Publication Date (W3CDTF): 1996
Place of Publication (Country Code): us
Text Language Code: eng
Target Audience: 一般
Data Provider (Database): 日本原子力研究開発機構 : 日本原子力研究開発機構所蔵目録データベース
https://library-documents.jaea.go.jp/opac/opac_search/