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図書

Reliability study of retention and memory gate integrity in a 1K MNOS RAM (Sandia report ; SAND-86-2079C; CONF-860872-1; DE86010483)

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Reliability study of retention and memory gate integrity in a 1K MNOS RAM

(Sandia report ; SAND-86-2079C; CONF-860872-1; DE86010483)

Material type
図書
Author
Nasby, R.D., Miller, W.M., White, R.L.
Publisher
Sandia National Labs.
Publication date
1986.01.
Material Format
Paper
Capacity, size, etc.
6p
NDC
-
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Paper

Material Type
図書
Title
Reliability study of retention and memory gate integrity in a 1K MNOS RAM
Author/Editor
Nasby, R.D., Miller, W.M., White, R.L.
Series Title
Sandia report ; SAND-86-2079C; CONF-860872-1; DE86010483
Author Heading
Nasby, R.D.
Miller, W.M.
White, R.L.
Publication, Distribution, etc.
Albuquerque, NM (USA) : Sandia National Labs.
Publication Date
1986.01.
Extent
6p
Place of Publication (Country Code)
us
Text Language Code
eng