Records of the IEEE International Workshop on Memory Technology, Design and Testing

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Records of the IEEE International Workshop on Memory Technology, Design and Testing

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Holding issue：: （On： IEEE Electronic Library (IEL):Full Text）上記の所蔵情報には、コンテンツ提供元の最新状況が反映されていない場合があります。特定の巻号の閲覧可否はお問い合わせください。The availability of this title on platform databases may have been changed. Please contact us for present information.

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Material Type: 電子書籍・電子雑誌
図書
ISBN: 0-7695-0689-5
Title: Records of the IEEE International Workshop on Memory Technology, Design and Testing
Publication Date: 2000
Abbreviated Title: MEMORY TECHNOLOGY, DESIGN AND TESTING, 2000. RECORDS OF THE 2000 IEEE INTERNATIONAL WORKSHOP ON
mtdt
Text Language Code: eng
Target Audience: 一般
Source: https://resolver.ndl.go.jp/ndl01?url_ver=Z39.88-2004&ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&rfr_id=info:sid/sfxit.com:opac_856&url_ctx_fmt=info:ofi/fmt:kev:mtx:ctx&sfx.ignore_date_threshold=1&rft.object_id=111026746701432&svc_val_fmt=info:ofi/fmt:kev:mtx:sch_svc&svc.fulltext=yes&
Access Restrictions: 国立国会図書館内限定公開
Service for the Digitized Contents Transmission Service: 図書館・個人送信対象外
Availability of remote photoduplication service: 可
Year and volume of holding: （On： IEEE Electronic Library (IEL):Full Text）
上記の所蔵情報には、コンテンツ提供元の最新状況が反映されていない場合があります。特定の巻号の閲覧可否はお問い合わせください。
The availability of this title on platform databases may have been changed. Please contact us for present information.
Data Provider (Database): 国立国会図書館 : NDL電子ブック・電子ジャーナル
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 111026746701432
http://id.ndl.go.jp/ejournal/111026746701432