IEE Colloquium on Techniques for Testing and Measuring Digital Systems

• Material Type: 電子書籍・電子雑誌; 図書
• Title: IEE Colloquium on Techniques for Testing and Measuring Digital Systems
• Publication Date: 1988
• Text Language Code: eng
• Target Audience: 一般
• Source: https://resolver.ndl.go.jp/ndl01?url_ver=Z39.88-2004&ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&rfr_id=info:sid/sfxit.com:opac_856&url_ctx_fmt=info:ofi/fmt:kev:mtx:ctx&sfx.ignore_date_threshold=1&rft.object_id=5280000000210358&svc_val_fmt=info:ofi/fmt:kev:mtx:sch_svc&svc.fulltext=yes&
• Access Restrictions: 国立国会図書館内限定公開
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• Availability of remote photoduplication service: 可
• Year and volume of holding: （On： IEEE Electronic Library (IEL):Full Text）; 上記の所蔵情報には、コンテンツ提供元の最新状況が反映されていない場合があります。特定の巻号の閲覧可否はお問い合わせください。; The availability of this title on platform databases may have been changed. Please contact us for present information.
• Data Provider (Database): 国立国会図書館 : NDL電子ブック・電子ジャーナル; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 5280000000210358; http://id.ndl.go.jp/ejournal/5280000000210358