Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995 : set pt. 1 pt. 2 pt. 3 pt. 4

Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995 : set

Material type: 図書

Author: edited by Masashi Suezawa and Hiroshi Katayama-Yoshida

Publisher: Trans Tech Publications

Publication date: c1995

Material Format: Paper

Capacity, size, etc.: 25 cm

NDC: 428.8

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Paper

Material Type: 図書
ISBN: 0878497161
0878497129
0878497137
0878497145
0878497153
Title: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995
Volume: : set
pt. 1
pt. 2
pt. 3
pt. 4
Author/Editor: edited by Masashi Suezawa and Hiroshi Katayama-Yoshida
Author Heading: International Conference on Defects in Semiconductors
https://ci.nii.ac.jp/author/DA01160090
Suezawa, Masashi
Katayama-Yoshida, Hiroshi
Publication, Distribution, etc.: Trans Tech Publications
Publication Date: c1995
Publication Date (W3CDTF): 1995
Size: 25 cm
Alternative Title: Defects in semiconductors 18
Place of Publication (Country Code): sz
Text Language Code: en
NDC 8th ed.: 428.8
Target Audience: 一般
Related Material: Materials science forum
https://cir.nii.ac.jp/crid/1130282271136849280
Related Material (URI): https://ci.nii.ac.jp/ncid/BA27177886#entity
Periodical Title: Materials science forum
https://cir.nii.ac.jp/crid/1130282271136849280
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA27177886 : BA27177886