Scanning electron microscopy and X-ray microanalysis : [pbk.] 3rd ed

Scanning electron microscopy and X-ray microanalysis : [pbk.]

3rd ed

Notes on use

Note (General)：: "Originally published by Springer Science+Business Media,LLC in 2003"--T.p. verso"Softcover reprint of the hardcover 3rd edition 2003"--T.p. verso"Cor...

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Material Type: 図書
ISBN: 9781461349693
Title: Scanning electron microscopy and X-ray microanalysis
Volume: : [pbk.]
Author/Editor: Joseph I. Goldstein, Dale E. Newbury ... [et al.]
Edition: 3rd ed
Author Heading: Goldstein, Joseph
https://ci.nii.ac.jp/author/DA01136369
Newbury, Dale E.
https://ci.nii.ac.jp/author/DA00478017
Publication, Distribution, etc.: Springer Science+Business Media
Publication Date: [201-], c2003
Size: 26 cm.
Place of Publication (Country Code): us
Text Language Code: en
Subject Heading: Scanning electron microscopy
X-ray microanalysis
Target Audience: 一般
Note (General): "Originally published by Springer Science+Business Media,LLC in 2003"--T.p. verso
"Softcover reprint of the hardcover 3rd edition 2003"--T.p. verso
"Corrected at 6th printing 2007"--T.p. verso
Includes bibliographical and index
Related Material (URI): https://ci.nii.ac.jp/ncid/BB1671047X#entity
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BB1671047X : BB1671047X