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Bibliographic Record
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- Material Type
- 図書
- ISBN
- 0780327977
- Author/Editor
- edited by Soon Huat Ong, MK Radhakrishnan ; organised by, IEEE Singapore Section, Reliability/CPMT/EDS Chapter ; technical co-sponsorship, IEEE Electron Devices Society ; in co-operation with National University of Singapore, Centre for IC Failure Analysis and Reliability, Institute of Microelectronics, Singapore, [and] Magnetics Technology Centre, Singapore
- Author Heading
- Publication, Distribution, etc.
- Publication Date
- c1995
- Publication Date (W3CDTF)
- 1995
- Size
- 30 cm
- Alternative Title
- 95TH8113