The examination of residuals for the detection of specification errors

Notes on use

Note (General)：: Microfilm/Xerographic. Reprint of author's thesis (Ph.D.)--University of Oregon, 1972Includes bibliographical references (l. 76-79)

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Material Type: 図書
Title: The examination of residuals for the detection of specification errors
Author/Editor: by George Walter Gipe
Author Heading: Gipe, George Walter
Publication, Distribution, etc.: University Microfilms
Publication Date: c1973
Publication Date (W3CDTF): 1973
Size: 21 cm
Place of Publication (Country Code): us
Text Language Code: en
Target Audience: 一般
Note (General): Microfilm/Xerographic. Reprint of author's thesis (Ph.D.)--University of Oregon, 1972
Includes bibliographical references (l. 76-79)
Related Material (URI): https://ci.nii.ac.jp/ncid/BA45121351#entity
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA45121351 : BA45121351