Jump to main content
図書

Microelectronic failure analysis : desk reference 3rd ed

Icons representing 図書

Microelectronic failure analysis : desk reference

3rd ed

Material type
図書
Author
Thomas W. Lee, editor, Seshu V. Pabbisetty, editor
Publisher
ASM International
Publication date
c1993
Material Format
Paper
Capacity, size, etc.
29cm
NDC
-
View All

Notes on use

Note (General):

Includes index

Search by Bookstore

Holdings of Libraries in Japan

This page shows libraries in Japan other than the National Diet Library that hold the material.

Please contact your local library for information on how to use materials or whether it is possible to request materials from the holding libraries.

other

  • CiNii Research

    Search Service
    Paper
    You can check the holdings of institutions and databases with which CiNii Research is linked at the site of CiNii Research.

Bibliographic Record

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Paper

Material Type
図書
ISBN
087170479X
Author/Editor
Thomas W. Lee, editor, Seshu V. Pabbisetty, editor
Edition
3rd ed
Publication, Distribution, etc.
Publication Date
c1993
Publication Date (W3CDTF)
1993
Size
29cm