Advances in imaging and electron physics v. 90 v. 91 v. 92 v. 93 v. 94 v. 95 v. 97 v. 98 v. 99 v. 100, partial cumulative index v. 101 v. 102 v. 103 v. 104 : cumulative index v. 105 v. 106 v. 107 v. 109 v. 110 v. 111 v. 112 v. 113 v. 114 v. 115 v. 117 v. 118 v. 120 v. 122 v. 123 v. 124 v. 125 v. 126 v. 127 v. 128 v. 129 v. 130 v. 131 v. 132 v. 134 v. 135 v. 136 v. 138 v. 139 v. 140 v. 141 v. 142 v. 144 v. 145 v. 146 v. 147 v. 148 v. 150 v. 151 v. 152 v. 156 v. 158 v. 160 v. 161 v. 162 v. 163 v. 164 v. 165 v. 166 v. 167 v. 168 v. 169 v. 170 v. 171 v. 175 v. 176 v. 177 v. 178 v. 179 v. 180 v. 181 v. 182 v. 183 v. 184 v. 185 v. 186 v. 187 v. 188 v. 190 v. 191 v. 193 v. 196 v. 197 v. 198 v. 199 v. 200 v. 201 v. 202 v. 203 v. 204 v. 205 v. 206 v. 207 v. 208 v. 209 v. 210 v. 211 v. 212 v. 213

Advances in imaging and electron physics v. 90

Material type: 図書

Author: edited by Peter W. Hawkes

Publisher: Academic Press

Publication date: 1995-

Material Format: Paper

Capacity, size, etc.: 24 cm

NDC: -

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Note (General)：: -v.89: Advances in electronics and electron physics子書誌ありv.128- published by Elsevier...

Related materials as well as pre- and post-revision versions

Electron microscopy and holography Electron-beam-induced nanometer-scale deposition Selected problems of computational charged particle optics Logarithmic image processing : theory and applications Theory of intense beams of charged particles Electron emission physics The Wien filter Silicon-based millimeter-wave technology : measurement, modeling and applications Sir Charles Oatley and the scanning electron microscope Aspects of image processing and compression Modern map methods in particle beam physics Neutron and X-ray microscopy Aspects of streak image tube photography Optics of charged particle analyzers Analytical, approximate-analytical and numerical methods in the design of energy analyzers Cold field emission and the scanning transmission electron microscope Time-resolved electron diffraction : for chemistry, biology and materials science Microscopy, spectroscopy, holography and crystallography with electrons Particles and waves in electron optics and microscopy Calculus of finite differences in quantum electrodynamics Dirac's difference equation and the physics of finite differences Aberration-corrected electron microscopy Dogma of the continuum and the calculus of finite differences in quantum physics Numerical field calculation for charged particle optics The leptonic magnetic monopole : theory and experiments The growth of electron microscopy Computer techniques for image processing in electron microscopy Morphological image operators

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Paper

Material Type: 図書
ISBN: 0120147327
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9780123813121
9780123858610
9780123813107
9780123859853
9780123859839
9780123859815
9780123943965
9780123942975
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9780124077027
9780124077010
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9780128002650
9780128001455
9780128001448
9780128002643
9780128022559
9780128022542
9780128023808
9780128022535
9780128048153
9780128048122
9780128048115
9780128048108
9780128120910
9780128120903
9780128120897
9780128120880
9780128120873
9780128120866
9780128152171
9780128152164
9780128152157
9780128152140
9780128171776
9780128171837
9780128174692
9780128174753
9780128209974
Title: Advances in imaging and electron physics
Volume: v. 90
v. 91
v. 92
v. 93
v. 94
v. 95
v. 97
v. 98
v. 99
v. 100, partial cumulative index
v. 101
v. 102
v. 103
v. 104 : cumulative index
v. 105
v. 106
v. 107
v. 109
v. 110
v. 111
v. 112
v. 113
v. 114
v. 115
v. 117
v. 118
v. 120
v. 122
v. 123
v. 124
v. 125
v. 126
v. 127
v. 128
v. 129
v. 130
v. 131
v. 132
v. 134
v. 135
v. 136
v. 138
v. 139
v. 140
v. 141
v. 142
v. 144
v. 145
v. 146
v. 147
v. 148
v. 150
v. 151
v. 152
v. 156
v. 158
v. 160
v. 161
v. 162
v. 163
v. 164
v. 165
v. 166
v. 167
v. 168
v. 169
v. 170
v. 171
v. 175
v. 176
v. 177
v. 178
v. 179
v. 180
v. 181
v. 182
v. 183
v. 184
v. 185
v. 186
v. 187
v. 188
v. 190
v. 191
v. 193
v. 196
v. 197
v. 198
v. 199
v. 200
v. 201
v. 202
v. 203
v. 204
v. 205
v. 206
v. 207
v. 208
v. 209
v. 210
v. 211
v. 212
v. 213
Author/Editor: edited by Peter W. Hawkes
Author Heading: Hawkes, P. W. (Peter William)
https://ci.nii.ac.jp/author/DA00588897
Hÿtch, Martin
Publication, Distribution, etc.: Academic Press
Publication Date: 1995-
Publication Date (W3CDTF): 1995
Size: 24 cm
Alternative Title: Advances in imaging and electron physics including proceedings CPO-10
Place of Publication (Country Code): us
Text Language Code: en
Target Audience: 一般
Note (General): -v.89: Advances in electronics and electron physics
子書誌あり
v.128- published by Elsevier
Includes bibliographical references and index
v. 210-212: edited by Peter W. Hawkes and Martin Hÿtch
v. 212: including proceedings CPO-10
Related Material: Electron microscopy and holography
https://cir.nii.ac.jp/crid/1130000793739848576
Electron-beam-induced nanometer-scale deposition
https://cir.nii.ac.jp/crid/1130000794533755392
Selected problems of computational charged particle optics
https://cir.nii.ac.jp/crid/1130000794788428672
Logarithmic image processing : theory and applications
https://cir.nii.ac.jp/crid/1130000794811770496
Theory of intense beams of charged particles
https://cir.nii.ac.jp/crid/1130000794875668096
Electron emission physics
https://cir.nii.ac.jp/crid/1130000795986888960
The Wien filter
https://cir.nii.ac.jp/crid/1130000796219956224
Silicon-based millimeter-wave technology : measurement, modeling and applications
https://cir.nii.ac.jp/crid/1130000796298166784
Sir Charles Oatley and the scanning electron microscope
https://cir.nii.ac.jp/crid/1130000796358460544
Aspects of image processing and compression
https://cir.nii.ac.jp/crid/1130000796929756800
Modern map methods in particle beam physics
https://cir.nii.ac.jp/crid/1130000796987870720
Neutron and X-ray microscopy
https://cir.nii.ac.jp/crid/1130000797179451520
Aspects of streak image tube photography
https://cir.nii.ac.jp/crid/1130000797238552192
Optics of charged particle analyzers
https://cir.nii.ac.jp/crid/1130000797502508928
Analytical, approximate-analytical and numerical methods in the design of energy analyzers
https://cir.nii.ac.jp/crid/1130282268717597952
Cold field emission and the scanning transmission electron microscope
https://cir.nii.ac.jp/crid/1130282268992481152
Time-resolved electron diffraction : for chemistry, biology and materials science
https://cir.nii.ac.jp/crid/1130282269165591808
Microscopy, spectroscopy, holography and crystallography with electrons
https://cir.nii.ac.jp/crid/1130282269334050816
Particles and waves in electron optics and microscopy
https://cir.nii.ac.jp/crid/1130282269401124736
Calculus of finite differences in quantum electrodynamics
https://cir.nii.ac.jp/crid/1130282269550806272
Dirac's difference equation and the physics of finite differences
https://cir.nii.ac.jp/crid/1130282270502127232
Aberration-corrected electron microscopy
https://cir.nii.ac.jp/crid/1130282270517287040
Dogma of the continuum and the calculus of finite differences in quantum physics
https://cir.nii.ac.jp/crid/1130282271353833344
Numerical field calculation for charged particle optics
https://cir.nii.ac.jp/crid/1130282271878726144
The leptonic magnetic monopole : theory and experiments
https://cir.nii.ac.jp/crid/1130282272239656320
The growth of electron microscopy
https://cir.nii.ac.jp/crid/1130282272526359168
Computer techniques for image processing in electron microscopy
https://cir.nii.ac.jp/crid/1130848327705301120
Morphological image operators
https://cir.nii.ac.jp/crid/1131130854626229376
Related Material (URI): https://ci.nii.ac.jp/ncid/BA24211536#entity
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA24211536 : BA24211536