Psychometrics for educational debates

Author: edited by Leo J. Th. van der Kamp, Willem F. Langerak, and Dato N. M. de Gruijter

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Note (General)：: "Proceedings of the Third International Symposium on Educational Testing, held in Leyden, The Netherlands, June 27-30, 1977."Includes bibliographies a...

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Material Type: 図書
ISBN: 0471275964
Title: Psychometrics for educational debates
Author/Editor: edited by Leo J. Th. van der Kamp, Willem F. Langerak, and Dato N. M. de Gruijter
Author Heading: International Symposium on Educational Testing
https://ci.nii.ac.jp/author/DA01312392
Kamp, Leo J. Th. van der
https://ci.nii.ac.jp/author/DA01312417
Langerak, Willem F.
https://ci.nii.ac.jp/author/DA01312428
Gruijter, Dato N. de
https://ci.nii.ac.jp/author/DA0131244X
Publication, Distribution, etc.: Wiley
Publication Date: c1980
Publication Date (W3CDTF): 1980
Size: 24 cm
Place of Publication (Country Code): uk
Text Language Code: en
Subject Heading: Educational tests and measurements -- Congresses
LCC: LB3051
Target Audience: 一般
Note (General): "Proceedings of the Third International Symposium on Educational Testing, held in Leyden, The Netherlands, June 27-30, 1977."
Includes bibliographies and indexes
Related Material (URI): https://ci.nii.ac.jp/ncid/BA00735871#entity
https://lccn.loc.gov/79004308
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA00735871 : BA00735871
LC Control Number: 79004308
https://lccn.loc.gov/79004308