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Bibliographic Record
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- Material Type
- 図書
- ISBN
- 0780377222
- Author/Editor
- edited by Philip HO ... [et al.] ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technically co-sponsored by IEEE Electron Devices Society, IEEE Reliability Society ; in co-operation with Centre for IC Failure Analysis & Reliability, National University of Singapore
- Author Heading
- Publication, Distribution, etc.
- Publication Date
- c2003
- Publication Date (W3CDTF)
- 2003
- Size
- 30 cm
- Alternative Title
- 10th International Symposium on the Physical & Failure Analysis of Integrated Circuits 2003IPFA 2003 proceedings03TH8662