Atomic force microscopy/scanning tunneling microscopy : [pbk.]

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Note (General)：: Originally published: Plenum Press, 1994"Proceedings of the First U.S. Army Natick Research, Development and Engineering Center Atomic Force Microscop...

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Material Type: 図書
ISBN: 9781475793246
Title: Atomic force microscopy/scanning tunneling microscopy
Volume: : [pbk.]
Author/Editor: edited by Samuel H. Cohen, Mona T. Bray, and Marcia L. Lightbody
Author Heading: Cohen, Samuel H.
https://ci.nii.ac.jp/author/DA09511552
Bray, Mona T.
https://ci.nii.ac.jp/author/DA09511563
Lightbody, Marcia L.
https://ci.nii.ac.jp/author/DA09511574
U.S. Army Natick Research, Development, and Engineering Center Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium
https://ci.nii.ac.jp/author/DA09511596
Publication, Distribution, etc.: Springer
Publication Date: c1994
Publication Date (W3CDTF): 1994
Size: 26 cm
Place of Publication (Country Code): us
Text Language Code: en
Subject Heading: Atomic force microscopy
Scanning tunneling microscopy
LCC: QH212.A78
Target Audience: 一般
Note (General): Originally published: Plenum Press, 1994
"Proceedings of the First U.S. Army Natick Research, Development and Engineering Center Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 8-10, 1993, in Natick, Massachusetts"--T.p. verso
Includes bibliographical references and index
Related Material (URI): https://ci.nii.ac.jp/ncid/BB22792945#entity
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BB22792945 : BB22792945