Machine vision for inspection and measurement

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Note (General)：: Proceedings of the second annual workshop on machine vision sponsored by the Center for Computer Aids for Industrial Productivity at Rutgers Universit...

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Material Type: 図書
ISBN: 0122667190
Title: Machine vision for inspection and measurement
Author/Editor: edited by Herbert Freeman
Author Heading: Freeman, Herbert
https://ci.nii.ac.jp/author/DA00451451
Rutgers University. Center for Computer Aids for Industrial Productivity
https://ci.nii.ac.jp/author/DA02610272
Publication, Distribution, etc.: Academic Press
Publication Date: c1989
Publication Date (W3CDTF): 1989
Size: 24 cm
Place of Publication (Country Code): us
Text Language Code: en
Subject Heading: Computer vision -- Congresses
Engineering inspection -- Congresses
LCC: TA1632
Target Audience: 一般
Note (General): Proceedings of the second annual workshop on machine vision sponsored by the Center for Computer Aids for Industrial Productivity at Rutgers University on Apr. 25-26, 1988
Includes bibliographies and index
Related Material: Perspectives in computing
https://cir.nii.ac.jp/crid/1130000794099334656
Related Material (URI): https://ci.nii.ac.jp/ncid/BA07762952#entity
https://lccn.loc.gov/89006940
Periodical Title: Perspectives in computing
https://cir.nii.ac.jp/crid/1130000794099334656
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA07762952 : BA07762952
LC Control Number: 89006940
https://lccn.loc.gov/89006940