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Bibliographic Record
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- Material Type
- 図書
- ISBN
- 0780374169
- Author/Editor
- edited by John Thong ... [et al.] ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technical co-sponsored by IEEE Electron Devices Society, IEEE Reliability Society ; in co-operation with Centre for IC Failure Analysis & Reliability, National University of Singapore
- Author Heading
- Publication, Distribution, etc.
- Publication Date
- c2002
- Publication Date (W3CDTF)
- 2002
- Size
- 30 cm
- Alternative Title
- 9th International Symposium on th Physical & Failure Analysis of Integrated Circuits 2002IPFA 2002 proceedings2TH8614