Proceedings, 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 3-5 November 2003, Boston, Massachusetts

Author: [edited by C. Bolchini ... [et al.] ] ; sponsored by the Counci the IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test Technology Technicall

Notes on use

Note (General)：: Includes bibliographical references and index"IEEE Computer Society Press Order Number PR02042"--on T.p. verso

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Material Type: 図書
ISBN: 0769520421
Title: Proceedings, 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 3-5 November 2003, Boston, Massachusetts
Author/Editor: [edited by C. Bolchini ... [et al.] ] ; sponsored by the Counci the IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test Technology Technicall
Author Heading: IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
https://ci.nii.ac.jp/author/DA1185577X
IEEE Computer Society. Test Technology Technical Council
https://ci.nii.ac.jp/author/DA1250352X
IEEE Computer Society. Technical Committee on Fault-Tolerant Computing
https://ci.nii.ac.jp/author/DA00923007
IEEE Computer Society
https://ci.nii.ac.jp/author/DA00479199
Bolchini, C.
Publication, Distribution, etc.: IEEE Computer Society
Publication Date: c2003
Publication Date (W3CDTF): 2003
Size: 23 cm
Alternative Title: DFT2003
PR02042
Place of Publication (Country Code): us
Text Language Code: en
Target Audience: 一般
Note (General): Includes bibliographical references and index
"IEEE Computer Society Press Order Number PR02042"--on T.p. verso
Related Material (URI): https://ci.nii.ac.jp/ncid/BA64469166#entity
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA64469166 : BA64469166