Fatigue and fracture test planning, test data acquisitions and analysis : pbk.

Material type: 図書

Author: editors, Zhigang Wei ... [et al.]

Publisher: ASTM International

Publication date: 2017

Material Format: Paper

Capacity, size, etc.: 23 cm

NDC: -

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Note (General)：: Other editors: Kamran Nikbin, Peter C. McKeighan, and D. Gary Harlow"Contains peer-reviewed papers that were presented at a symposium held May 4-5, 20...

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Paper

Material Type: 図書
ISBN: 9780803176393
Title: Fatigue and fracture test planning, test data acquisitions and analysis
Volume: : pbk.
Author/Editor: editors, Zhigang Wei ... [et al.]
Author Heading: Symposium on Fatigue and Fracture Test Planning, Test Data Acquisitions and Analysis
Wei, Zhigang
Nikbin, Kamran M.
McKeighan, P. C. (Peter C.)
Harlow, D. Gary
ASTM Committee E-8 on Fatigue and Fracture
https://ci.nii.ac.jp/author/DA09542760
ASTM Subcommittee E08.03 on Advanced Apparatus and Techniques
American Society for Testing and Materials
https://ci.nii.ac.jp/author/DA00669569
Publication, Distribution, etc.: ASTM International
Publication Date: 2017
Publication Date (W3CDTF): 2017
Size: 23 cm
Place of Publication (Country Code): us
Text Language Code: en
Subject Heading: Materials -- Fatigue
LCC: TA418.38
Target Audience: 一般
Note (General): Other editors: Kamran Nikbin, Peter C. McKeighan, and D. Gary Harlow
"Contains peer-reviewed papers that were presented at a symposium held May 4-5, 2016, in San Antonio, Texas, USA. The symposium was sponsored by ASTM International Committee E08 on Fatigue and Fracture and Subcommittee E08.03 on Advanced Apparatus and Techniques"--Foreword
"ASTM Stock #STP1598"--T.p
Includes bibliographical references
Related Material: Selected technical papers
https://cir.nii.ac.jp/crid/1130000794354085120
Related Material (URI): https://ci.nii.ac.jp/ncid/BB2379161X#entity
https://lccn.loc.gov/2017000407
Periodical Title: Selected technical papers
https://cir.nii.ac.jp/crid/1130000794354085120
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BB2379161X : BB2379161X
LC Control Number: 2017000407
https://lccn.loc.gov/2017000407