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Bibliographic Record
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- Material Type
- 図書
- ISBN
- 0780366751
- Author/Editor
- edited by Wilson Tan ... [et al.] ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technical co-sponsored by IEEE Electron Devices Society ; in co-operation with Centre for IC Failure Analysis & Reliability, National University of Singapore, Institute of Microelectronics, Singapore
- Author Heading
- Publication, Distribution, etc.
- Publication Date
- c2001
- Publication Date (W3CDTF)
- 2001
- Size
- 30 cm
- Alternative Title
- 8th International Symposium on th Physical & Failure Analysis of Integrated Circuits 2001IPFA 2001