ISAF 2000, proceedings of the 2000 12th IEEE International Symposium on Applications of Ferroelectrics, Honolulu, Hawaii, U.S.A., July 21-August 2, 2000 v.1 : casebound v.2 : casebound

ISAF 2000, proceedings of the 2000 12th IEEE International Symposium on Applications of Ferroelectrics, Honolulu, Hawaii, U.S.A., July 21-August 2, 2000 v.1 : casebound

Material type: 図書

Author: editors, S. K. Streiffer, ... [et al.] ; [organized by] the Institute of Electrical and Electronic Engineers, Ultrasonics, Ferroelectrics and Frequency Control Society

Publisher: IEEE Service Center

Publication date: c2001

Material Format: Paper

Capacity, size, etc.: 28 cm

NDC: -

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Notes on use

Note (General)：: Includes bibliographies"IEEE Catalog Number 00CH37076"

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Paper

Material Type: 図書
ISBN: 0780359402
0780359410
Title: ISAF 2000, proceedings of the 2000 12th IEEE International Symposium on Applications of Ferroelectrics, Honolulu, Hawaii, U.S.A., July 21-August 2, 2000
Volume: v.1 : casebound
v.2 : casebound
Author/Editor: editors, S. K. Streiffer, ... [et al.] ; [organized by] the Institute of Electrical and Electronic Engineers, Ultrasonics, Ferroelectrics and Frequency Control Society
Author Heading: IEEE International Symposium on Applications of Ferroelectrics
https://ci.nii.ac.jp/author/DA03204313
Institute of Electrical and Electronics Engineers
https://ci.nii.ac.jp/author/DA00739948
Streiffer, S. K.
Publication, Distribution, etc.: IEEE Service Center
Publication Date: c2001
Publication Date (W3CDTF): 2001
Size: 28 cm
Alternative Title: 2000 IEEE International Symposium on Applications on Ferroelectrics
00CH37076
Place of Publication (Country Code): us
Text Language Code: en
Subject Heading: Ferroelectric devices -- Congresses
Target Audience: 一般
Note (General): Includes bibliographies
"IEEE Catalog Number 00CH37076"
Related Material (URI): https://ci.nii.ac.jp/ncid/BA56767646#entity
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA56767646 : BA56767646