図書

Ion beam surface layer analysis : proceedings of the International Conference held on June 18-20, 1973, in Yorktown Heights, N.Y., and sponsored by the National Science Foundation and the IBM Corporation

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Ion beam surface layer analysis : proceedings of the International Conference held on June 18-20, 1973, in Yorktown Heights, N.Y., and sponsored by the National Science Foundation and the IBM Corporation

Material type
図書
Author
edited by James W. Mayer and James F. Ziegler
Publisher
Elsevier Sequoia S.A.
Publication date
1974
Material Format
Paper
Capacity, size, etc.
25 cm
NDC
-
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Note (General):

"These proceedings were originally published in Thin solid films." -- T.p.Includes bibliographical references

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Paper

Material Type
図書
ISBN
044419536X
Author/Editor
edited by James W. Mayer and James F. Ziegler
Publication, Distribution, etc.
Publication Date
1974
Publication Date (W3CDTF)
1974
Size
25 cm
Place of Publication (Country Code)
sz