欠陥制御・界面制御に基づく窒化ガリウム系デバイス構造の高信頼化

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Material Type: 図書
Title: 欠陥制御・界面制御に基づく窒化ガリウム系デバイス構造の高信頼化
Title Transcription: ケッカンセイギョカイメンセイギョニモトズクチッカガリウムケイデバイスコウゾウノコウシンライカ
Author/Editor: 研究代表者橋詰保
Author Heading: 橋詰, 保ハシズメ, タモツ
https://ci.nii.ac.jp/author/DA18262142
Publication, Distribution, etc.: [北海道大学量子集積エレクトロニクス研究センター]
Publication Date: 2007.4
Publication Date (W3CDTF): 2007
Size: 30cm
Place of Publication (Country Code): ja
Target Audience: 一般
Note (General): 課題番号: 17360133
片面印刷
Related Material: 科学研究費補助金(基盤研究(B))研究成果報告書
https://cir.nii.ac.jp/crid/1130282271762841472
Related Material (URI): https://ci.nii.ac.jp/ncid/BA83084635#entity
Periodical Title: 科学研究費補助金(基盤研究(B))研究成果報告書
https://cir.nii.ac.jp/crid/1130282271762841472
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA83084635 : BA83084635