Électronique appliquée : examens d'électronicien (C.A.P. B.E.P. B.P. B.T.)

Author: par M. Bibal, P. Heiny ; avec la collaboration de A. Chevalier et R. Cluzel

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Material Type: 図書
Title: Électronique appliquée : examens d'électronicien (C.A.P. B.E.P. B.P. B.T.)
Author/Editor: par M. Bibal, P. Heiny ; avec la collaboration de A. Chevalier et R. Cluzel
Author Heading: Bibal, M.
Heiny, P.
Chevalier, A.
Cluzel, R.
https://ci.nii.ac.jp/author/DA05079540
Publication, Distribution, etc.: Delagrave
Publication Date: 1968
Publication Date (W3CDTF): 1968
Size: 22 cm
Place of Publication (Country Code): fr
Text Language Code: fr
Subject Heading: Electronics -- Handbooks, manuals, etc
LCC: TK7825
Target Audience: 一般
Note (General): avec compléments Semi-conducteurs -- On cover
Related Material: Techniques et normalisation
https://cir.nii.ac.jp/crid/1130282270854714112
Related Material (URI): https://ci.nii.ac.jp/ncid/BA71340818#entity
Periodical Title: Techniques et normalisation
https://cir.nii.ac.jp/crid/1130282270854714112
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA71340818 : BA71340818