図書

Proceedings : 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, November 2-4, 1998, Austin, Texas : microfiche

Icons representing 図書

Proceedings : 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, November 2-4, 1998, Austin, Texas : microfiche

Material type
図書
Author
sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test Technology Technical Committee
Publisher
IEEE Computer Society
Publication date
c1998
Material Format
Paper
Capacity, size, etc.
23 cm
NDC
-
View All

Notes on use

Note (General):

Includes bibliographical references and index"IEEE Computer Society Press order number PR08832""IEEE order plan catalog number 98EX223"

Search by Bookstore

Holdings of Libraries in Japan

This page shows libraries in Japan other than the National Diet Library that hold the material.

Please contact your local library for information on how to use materials or whether it is possible to request materials from the holding libraries.

other

  • CiNii Research

    Search Service
    Paper
    You can check the holdings of institutions and databases with which CiNii Research is linked at the site of CiNii Research.

Bibliographic Record

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Paper

Material Type
図書
ISBN
0818688327
0818688351
Volume
: microfiche
Author/Editor
sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test Technology Technical Committee
Publication, Distribution, etc.
Publication Date
c1998
Publication Date (W3CDTF)
1998
Size
23 cm