Proceedings : International Test Conference 2000, [October 3-5, 2000, New Atlantic City Convention Center, Atlantic City, NJ, USA] : soft : case : microfiche

Proceedings : International Test Conference 2000, [October 3-5, 2000, New Atlantic City Convention Center, Atlantic City, NJ, USA] : soft

Material type: 図書

Author: [sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]

Publisher: International Test Conference

Publication date: c2000

Material Format: Paper

Capacity, size, etc.: 29 cm

NDC: -

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Notes on use

Note (General)：: "IEEE Catalog Number 00CH37159"--T.p. versoIncludes bibliographies and index

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Paper

Material Type: 図書
ISBN: 0780365461
078036547X
0780365488
Title: Proceedings : International Test Conference 2000, [October 3-5, 2000, New Atlantic City Convention Center, Atlantic City, NJ, USA]
Volume: : soft
: case
: microfiche
Author/Editor: [sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]
Author Heading: International Test Conference
https://ci.nii.ac.jp/author/DA0261156X
IEEE Computer Society
https://ci.nii.ac.jp/author/DA00479199
IEEE Computer Society. Test Technology Technical Council
https://ci.nii.ac.jp/author/DA1250352X
Institute of Electrical and Electronics Engineers. Philadelphia Section
https://ci.nii.ac.jp/author/DA02648490
Publication, Distribution, etc.: International Test Conference
Publication Date: c2000
Publication Date (W3CDTF): 2000
Size: 29 cm
Alternative Title: ITC : International Test Conference 2000 : proceedings
Place of Publication (Country Code): us
Text Language Code: en
Subject Heading: Integrated circuits -- Testing -- Congresses
Automatic checkout equipment -- Congresses
Target Audience: 一般
Note (General): "IEEE Catalog Number 00CH37159"--T.p. verso
Includes bibliographies and index
Related Material (URI): https://ci.nii.ac.jp/ncid/BA49486625#entity
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA49486625 : BA49486625