Fundamental issues and applications of shock-wave and high strain-rate phenomena : proceedings of the 2000 International Conference on Fundamental Issues and Applications of Shock-Wave and High-Strain-Rate Phenomena (EXPLOMET '2000)

Fundamental issues and applications of shock-wave and high strain-rate phenomena : proceedings of the 2000 International Conference on Fundamental Issues and Applications of Shock-Wave and High-Strain-Rate Phenomena (EXPLOMET '2000)

Material type: 図書

Author: edited by Karl P. Staudhammer, Lawrence E. Murr, Marc A. Meyers

Publisher: Elsevier Science

Publication date: 2001

Material Format: Paper

Capacity, size, etc.: 27 cm

NDC: -

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Notes on use

Note (General)：: Includes bibliographical references and indexes

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Paper

Material Type: 図書
ISBN: 0080438962
Title: Fundamental issues and applications of shock-wave and high strain-rate phenomena : proceedings of the 2000 International Conference on Fundamental Issues and Applications of Shock-Wave and High-Strain-Rate Phenomena (EXPLOMET '2000)
Author/Editor: edited by Karl P. Staudhammer, Lawrence E. Murr, Marc A. Meyers
Author Heading: International Conference on Fundamental Issues and Applications of Shock-Wave and High-Strain-Rate Phenomena
https://ci.nii.ac.jp/author/DA13207613
Staudhammer, Karl P.
https://ci.nii.ac.jp/author/DA01483169
Murr, Lawrence Eugene
https://ci.nii.ac.jp/author/DA01483136
Meyers, Marc A.
https://ci.nii.ac.jp/author/DA00208147
Publication, Distribution, etc.: Elsevier Science
Publication Date: 2001
Publication Date (W3CDTF): 2001
Size: 27 cm
Place of Publication (Country Code): us
Text Language Code: en
Subject Heading: Impact Congresses
Shock waves Congresses
Deformations (Mechanics) Congresses
Strains and stresses Congresses
LCC: TA354
Target Audience: 一般
Note (General): Includes bibliographical references and indexes
Related Material (URI): https://ci.nii.ac.jp/ncid/BA53427313#entity
https://lccn.loc.gov/00052158
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA53427313 : BA53427313
LC Control Number: 00052158
https://lccn.loc.gov/00052158