Trace analysis and technological development : special and contributed papers presented at an international symposium held at Bhabha Atomic Research Centre, Bombay (February 16-19, 1981)

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Note (General)：: Co-sponsored by International Union of Pure and Applied Chemistry"Presented at the First International Symposium on Trace Analysis and Technological D...

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Material Type: 図書
ISBN: 047027462X
Title: Trace analysis and technological development : special and contributed papers presented at an international symposium held at Bhabha Atomic Research Centre, Bombay (February 16-19, 1981)
Author/Editor: editor, M. Sankar Das
Author Heading: Das, M. Sankar
https://ci.nii.ac.jp/author/DA08114025
International Symposium on Trace Analysis and Technological Development (1st : 1981 : Bhabha Atomic Research Centre)
International Union of Pure and Applied Chemistry
Publication, Distribution, etc.: Wiley
Publication Date: c1983
Publication Date (W3CDTF): 1983
Size: 26 cm
Place of Publication (Country Code): us
Subject Heading: Trace analysis -- Congresses
LCC: QD139.T7
Target Audience: 一般
Note (General): Co-sponsored by International Union of Pure and Applied Chemistry
"Presented at the First International Symposium on Trace Analysis and Technological Development"--Pref
"A Halsted Press book."
Includes bibliographical references
Related Material (URI): https://ci.nii.ac.jp/ncid/BA2201971X#entity
https://lccn.loc.gov/83012788
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA2201971X : BA2201971X
LC Control Number: 83012788
https://lccn.loc.gov/83012788