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Frontiers in electronic testing

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Frontiers in electronic testing

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図書
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Kluwer Academic Publishers
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Paper
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Notes on use

Note (General):

Publisher varies: Springer

Related materials as well as pre- and post-revision versions

Analog and mixed-signal boundary-scan : a guide to the IEEE 1149.4 test standardLeave the NDL website. Fault diagnosis of analog integrated circuitsLeave the NDL website. Fault injection techniques and tools for embedded systems reliability evaluationLeave the NDL website. Soft errors in modern electronic systemsLeave the NDL website. Data mining and diagnosing IC failsLeave the NDL website. Digital timing measurements : from scopes and probes to timing and jitterLeave the NDL website. High performance memory testing : design principles, fault modeling, and self-testLeave the NDL website. CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and testLeave the NDL website. Embedded processor-based self-testLeave the NDL website. Power-constrained testing of VLSI circuitsLeave the NDL website. A designer's guide to built-in self-testLeave the NDL website. From contamination to defects, faults, and yield loss : simulation and applicationsLeave the NDL website. New methods of concurrent checkingLeave the NDL website. Economics of electronic design, manufacture, and testLeave the NDL website. Verification by error modeling : using testing techniques in hardware verificationLeave the NDL website. Multi-chip module test strategiesLeave the NDL website. Efficient branch and bound search with application to computer-aided designLeave the NDL website. Reasoning in Boolean networks : logic synthesis and verification using testing techniquesLeave the NDL website. Testability concepts for digital ICs : the macro test approachLeave the NDL website. Defect oriented testing for CMOS analog and digital circuitsLeave the NDL website. Elements of STIL : principles and applications of IEEE Std. 1450Leave the NDL website. Introduction to advanced system-on-chip test design and optimizationLeave the NDL website. Testing static random access memories : defects, fault models, and test patternsLeave the NDL website. Oscillation-based test in mixed-signal circuitsLeave the NDL website. Introduction to I[ ]D[ ]D[ ]Q[ ] testingLeave the NDL website. Emerging nanotechnologies : test, defect tolerance, and reliabilityLeave the NDL website. Research perspectives and case studies in system test and diagnosisLeave the NDL website. Boundary-scan interconnect diagnosisLeave the NDL website. Models in hardware testing : lecture notes of the forum in honor of Christian LandraultLeave the NDL website. Delay fault testing for VLSI circuitsLeave the NDL website. Defect-oriented testing for nano-metric CMOS VLSI circuitsLeave the NDL website. Fault-tolerance techniques for SRAM-based FPGAsLeave the NDL website. IDDQ testing of VLSI circuitsLeave the NDL website. Test resource partitioning for system-on-a-chipLeave the NDL website. Testing and testable design of high-density random-access memoriesLeave the NDL website. SOC (system-on-a-chip) testing for plug and play test automationLeave the NDL website. SOC (System-on-a-Chip) testing for plug and play test automationLeave the NDL website. Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuitsLeave the NDL website. Advances in electronic testing : challenges and methodologiesLeave the NDL website. The core test wrapper handbook : rationale and application of IEEE Std. 1500Leave the NDL website. Formal equivalence checking and design debuggingLeave the NDL website.

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Paper

Material Type
図書
Publication, Distribution, etc.
Alternative Title
FRET
Place of Publication (Country Code)
us
Target Audience
一般
Note (General)
Publisher varies: Springer
Related Material
Analog and mixed-signal boundary-scan : a guide to the IEEE 1149.4 test standard
Fault diagnosis of analog integrated circuits
Fault injection techniques and tools for embedded systems reliability evaluation
Soft errors in modern electronic systems
Data mining and diagnosing IC fails
Digital timing measurements : from scopes and probes to timing and jitter
High performance memory testing : design principles, fault modeling, and self-test
CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test
Embedded processor-based self-test
Power-constrained testing of VLSI circuits
A designer's guide to built-in self-test
From contamination to defects, faults, and yield loss : simulation and applications
New methods of concurrent checking
Economics of electronic design, manufacture, and test
Verification by error modeling : using testing techniques in hardware verification
Multi-chip module test strategies
Efficient branch and bound search with application to computer-aided design
Reasoning in Boolean networks : logic synthesis and verification using testing techniques
Testability concepts for digital ICs : the macro test approach
Defect oriented testing for CMOS analog and digital circuits
Elements of STIL : principles and applications of IEEE Std. 1450
Introduction to advanced system-on-chip test design and optimization
Testing static random access memories : defects, fault models, and test patterns
Oscillation-based test in mixed-signal circuits
Introduction to I[ ]D[ ]D[ ]Q[ ] testing
Emerging nanotechnologies : test, defect tolerance, and reliability
Research perspectives and case studies in system test and diagnosis
Boundary-scan interconnect diagnosis
Models in hardware testing : lecture notes of the forum in honor of Christian Landrault
Delay fault testing for VLSI circuits
Defect-oriented testing for nano-metric CMOS VLSI circuits
Fault-tolerance techniques for SRAM-based FPGAs
IDDQ testing of VLSI circuits
Test resource partitioning for system-on-a-chip
Testing and testable design of high-density random-access memories
SOC (system-on-a-chip) testing for plug and play test automation
SOC (System-on-a-Chip) testing for plug and play test automation
Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
Advances in electronic testing : challenges and methodologies
The core test wrapper handbook : rationale and application of IEEE Std. 1500
Formal equivalence checking and design debugging
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