Records of the IEEE International Workshop on Memory Technology, Design, and Testing, August 8-9, 1994, San Jose, California

Material type: 図書

Author: edited by R. Rajsuman ; sponsored by IEEE Computer Society Technical Committee on Test Technology in cooperation with the IEEE Computer Society Technical Committee on VLSI

Publisher: IEEE Computer Society Press

Publication date: c1994

Material Format: Paper

Capacity, size, etc.: 28 cm

NDC: -

View All

Notes on use

Note (General)：: "IEEE catalog number 94TH0656-9"--T.p. versoIncludes bibliographical references and index

Search by Bookstore

Holdings of Libraries in Japan

This page shows libraries in Japan other than the National Diet Library that hold the material.

List of Cooperating Institutions and Databases

Please contact your local library for information on how to use materials or whether it is possible to request materials from the holding libraries.

other

CiNii Research
Search Service
Paper
You can check the holdings of institutions and databases with which CiNii Research is linked at the site of CiNii Research.
Check the holdings of this book

Search by Bookstore

Bibliographic Record

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Paper

Material Type: 図書
ISBN: 081866245X
Title: Records of the IEEE International Workshop on Memory Technology, Design, and Testing, August 8-9, 1994, San Jose, California
Author/Editor: edited by R. Rajsuman ; sponsored by IEEE Computer Society Technical Committee on Test Technology in cooperation with the IEEE Computer Society Technical Committee on VLSI
Author Heading: IEEE International Workshop on Memory Testing
https://ci.nii.ac.jp/author/DA09002934
Rajsuman, Rochit
https://ci.nii.ac.jp/author/DA06745397
IEEE Computer Society. Test Technology Technical Committee
https://ci.nii.ac.jp/author/DA03323957
IEEE Computer Society. Technical Committee on VLSI
https://ci.nii.ac.jp/author/DA04967445
Publication, Distribution, etc.: IEEE Computer Society Press
Publication Date: c1994
Publication Date (W3CDTF): 1994
Size: 28 cm
Alternative Title: 94TH06569
Place of Publication (Country Code): us
Subject Heading: Semiconductor storage devices -- Testing -- Congresses
Random access memory -- Congresses
LCC: TK7895.M4
Target Audience: 一般
Note (General): "IEEE catalog number 94TH0656-9"--T.p. verso
Includes bibliographical references and index
Related Material (URI): https://ci.nii.ac.jp/ncid/BA24796509#entity
https://lccn.loc.gov/94075844
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA24796509 : BA24796509
LC Control Number: 94075844
https://lccn.loc.gov/94075844