Proceedings : Seventh Asian Test Symposium (ATS '98), December 2-4, 1998, Singapore

Author: sponsored by IEEE Computer Society Test Technology Technical Committee, Computer Chapter of IEEE Singapore Section, Singapore Polytechnic ; in cooperation with National University of Singapore, Nanyang Technological University

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Note (General)：: "IEEE order plan catalog number 98TB100259"Includes bibliographies and index

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Material Type: 図書
ISBN: 0818682779
Title: Proceedings : Seventh Asian Test Symposium (ATS '98), December 2-4, 1998, Singapore
Author/Editor: sponsored by IEEE Computer Society Test Technology Technical Committee, Computer Chapter of IEEE Singapore Section, Singapore Polytechnic ; in cooperation with National University of Singapore, Nanyang Technological University
Author Heading: Asian Test Symposium
https://ci.nii.ac.jp/author/DA08856639
IEEE Singapore Section. Computer Chapter
https://ci.nii.ac.jp/author/DA09948266
IEEE Computer Society. Technical Committee on Test Technology
https://ci.nii.ac.jp/author/DA10231349
Publication, Distribution, etc.: IEEE Computer Society Press
Publication Date: c1998
Publication Date (W3CDTF): 1998
Size: 28 cm
Alternative Title: 98TB100259
Place of Publication (Country Code): us
Text Language Code: en
Subject Heading: Integrated circuits -- Testing -- Congresses
Automatic test equipment -- Congresses
LCC: TK7874
Target Audience: 一般
Note (General): "IEEE order plan catalog number 98TB100259"
Includes bibliographies and index
Related Material (URI): https://ci.nii.ac.jp/ncid/BA43822741#entity
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA43822741 : BA43822741