図書

1997 2nd International Symposium on Plasma Process-Induced Damage : 13-14 May 1997, Monterey, California, USA : softbound : microfiche

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1997 2nd International Symposium on Plasma Process-Induced Damage : 13-14 May 1997, Monterey, California, USA : softbound

Material type
図書
Author
editors, Kim P. Cheung, Moritaka Nakamura, and Calvin T. Gabriel ; technical co-sponsors, IEEE/Electron Devices Society, American Vacuum Society, Japanese Society of Applied Physics
Publisher
Northern California Chapter of the American Vacuum Society
Publication date
c1997
Material Format
Paper
Capacity, size, etc.
28 cm
NDC
-
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Notes on use

Note (General):

"IEEE catalog no. 97TH8265"--T.p. versoIncludes bibliographical references and index

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Paper

Material Type
図書
ISBN
0965157717
0780338227
Volume
: softbound
: microfiche
Author/Editor
editors, Kim P. Cheung, Moritaka Nakamura, and Calvin T. Gabriel ; technical co-sponsors, IEEE/Electron Devices Society, American Vacuum Society, Japanese Society of Applied Physics
Publication Date
c1997
Publication Date (W3CDTF)
1997
Size
28 cm