ICMTS 1989 : Proceedings of the 1989 International Conference on Microelectronic Test Structures, Edinburgh - Scotland, 13-14th March 1989

Notes on use

Note (General)：: Sponsored by the IEEE Electron Devices SocietyIncludes bibliographiesIEEE Catalog Number 89CH2693-0

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Material Type: 図書
ISBN: 0879427140
Title: ICMTS 1989 : Proceedings of the 1989 International Conference on Microelectronic Test Structures, Edinburgh - Scotland, 13-14th March 1989
Author Heading: IEEE International Conference on Microelectronic Test Structures
https://ci.nii.ac.jp/author/DA03840992
IEEE Electron Devices Society
https://ci.nii.ac.jp/author/DA01257512
Publication, Distribution, etc.: Institute of Electrical and Electronics Engineers, c1989
Publication Date (W3CDTF): 1989
Size: 30 cm
Alternative Title: 1989 IEEE International Conference on Microelectronic Test Structures
89CH26930
Place of Publication (Country Code): us
Text Language Code: en
Subject Heading: Integrated circuits -- Testing -- Congresses
Target Audience: 一般
Note (General): Sponsored by the IEEE Electron Devices Society
Includes bibliographies
IEEE Catalog Number 89CH2693-0
Related Material (URI): https://ci.nii.ac.jp/ncid/BA07667554#entity
https://lccn.loc.gov/88084125
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA07667554 : BA07667554
LC Control Number: 88084125
https://lccn.loc.gov/88084125