ICMTS 2000, proceedings of the 2000 IEEE International Conference on Microelectronic Test Structures, March 13-16, 2000, DoubleTree Hotel, Monterey, California

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Note (General)：: "IEEE catalog number: 00CH37095"--T.p. versoIncludes bibliographical references and index

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Material Type: 図書
Title: ICMTS 2000, proceedings of the 2000 IEEE International Conference on Microelectronic Test Structures, March 13-16, 2000, DoubleTree Hotel, Monterey, California
Author/Editor: sponsored by the IEEE Electron Devices Society
Author Heading: IEEE International Conference on Microelectronic Test Structures
https://ci.nii.ac.jp/author/DA03840992
IEEE Electron Devices Society
https://ci.nii.ac.jp/author/DA01257512
Publication, Distribution, etc.: Institute of Electrical and Electronics Engineers
Publication Date: c1999
Publication Date (W3CDTF): 2000
Size: 29 cm
Alternative Title: 00CH37095
Place of Publication (Country Code): us
Text Language Code: en
Target Audience: 一般
Note (General): "IEEE catalog number: 00CH37095"--T.p. verso
Includes bibliographical references and index
Related Material (URI): https://ci.nii.ac.jp/ncid/BA4830100X#entity
https://lccn.loc.gov/00000239
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA4830100X : BA4830100X
LC Control Number: 00000239
https://lccn.loc.gov/00000239