Test and diagnosis for small-delay defects

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Material Type: 図書
ISBN: 9781441982964
Title: Test and diagnosis for small-delay defects
Author/Editor: Mohammad Tehranipoor, Ke Peng, Krishnendu Chakrabarty
Author Heading: Tehranipoor, Mohammad H.
Peng, Ke
Chakrabarty, Krishnendu
https://ci.nii.ac.jp/author/DA15240223
Publication, Distribution, etc.: Springer
Publication Date: c2011
Publication Date (W3CDTF): 2011
Size: 24 cm.
Place of Publication (Country Code): us
Text Language Code: en
Subject Heading: Integrated circuits -- Very large scale integration -- Defects
Integrated circuits -- Very large scale integration -- Testing
Delay faults (Semiconductors)
Target Audience: 一般
Related Material (URI): https://ci.nii.ac.jp/ncid/BB0887100X#entity
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BB0887100X : BB0887100X